|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||L-4: Error Analysis of the Dictionary Approach to Electron Backscatter Diffraction Indexing
||Farangis Ram, Saransh Singh, Marc De Graef
|On-Site Speaker (Planned)
The dictionary approach is an alternative to the standard 2D Hough transform approach to electron backscatter diffraction (EBSD) indexing, and is particularly effective for low crystal symmetry or very low quality EBSD patterns. The pattern orientation is determined by comparison with a dictionary of dynamical, forward modeled EBSPs. We report on the efficacy of the dictionary approach. Efficacy is quantified through evaluation of the error of estimated orientations and disorientations. Error analysis is performed using test patterns simulated by a dynamical EBSD forward model. Simulated patterns that closely resemble experimental patterns are key to this analysis. Error analysis reveals that for a cubic material, in a standard EBSD set-up with an almost 80 capture angle and a 1% of pattern width error in projection center, the mean orientation accuracy is 1° with a standard deviation of 0.2°. To achieve this accuracy, a collected pattern size of 30×30 pixels is sufficient.
||Planned: Supplemental Proceedings volume