|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Coherent Imaging
||Polychromatic Bragg Coherent X-ray Diffraction Imaging for Rapid Measurements
||Wonsuk Cha, Stephan O. Hruszkewycz, Matthew J. Highland, Ross Harder, Wenjun Liu, Ruqing Xu, Paul H. Fuoss
|On-Site Speaker (Planned)
Coherent x-ray diffraction imaging (CDI) performed in Bragg geometry has been employed as a powerful technique to examine three-dimensional strain distributions within nanocrystals. However the current state-of-art of CDI requires significant time to perform three-dimensional scans making it incompatible with most time-resolved studies. In this talk, I will discuss a new approach for CDI with the goal of obtaining three-dimensional coherent x-ray diffraction patterns without scanning samples. Polychromatic coherent x-ray delivered by third-generation synchrotron sources allows transient diffraction patterns collected during phase transition of the sample within short time. It also makes CDI on complex heterogeneous crystalline materials simplified with a two stage, screening and imaging process. This innovative approach may provide opportunities for time-resolved Bragg CDI studies.
||Planned: Supplemental Proceedings volume