|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Multi-angle Bragg Projection Ptychography with Probe Retrieval
||Peng Li, Felix Hofmann, Steven Leake, Marc Allain, Virginie Chamard
|On-Site Speaker (Planned)
X-ray Bragg ptychography is a scanning coherent diffraction imaging microscopy technique that can produce 3D maps of the crystalline structure of an extended nanostructured crystal at about 10nm resolution. With Bragg projection ptychography, the 3D maps can be extracted from an extremely sparse data-set. This new strategy substantially reduces the acquisition time and mitigates problems, linked to radiation damage and instabilities, faced by conventional Bragg ptychography. However, the success of the image reconstruction is based on a good knowledge of the probe, whose uncertainties degrade the object reconstruction.
In this talk, we solve this problem by proposing a simultaneous reconstruction of the probe and object functions. This is based on a strong but natural constraint of the probe properties. We demonstrate our approach on a He-implanted poly-crystalline Tungsten sample measured at ID01-ESRF. These findings open new possibilities for this imaging technique.
Project supported by European Research Council (H2020 grant #72881).
||Planned: Supplemental Proceedings volume