|About this Abstract
||Materials Science & Technology 2012
||MS&T'12 Poster Session
||E9: Improving the Confidence Level of TEM-Based Orientation Maps
||Han Leng, Marc De Graef
|On-Site Speaker (Planned)
Orientation maps of fine-grained materials acquired in the transmission electron microscope using NanoMegas AStar technique often have regions with a low confidence index. In this contribution, we propose a technique that employs multiple orientation maps from the same sample area but with different sample tilts to increase the overall confidence index. Our technique is based on registration of the individual maps using a mutual information approach, and subsequent merging of the individual maps using a voting scheme, resulting in a combined orientation map with a higher average confidence index. We will provide examples using several experimental data sets.
||Definite: A CD-only volume