|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Coherent Imaging
||In-situ Phase Contrast Nano-tomography at ID16B
||Julie Villanova, Richi Kumar, Rémi Daudin, Pierre Lhuissier, Luc Salvo, David Jauffrès, Christophe L. Martin, Rémi Tucoulou
|On-Site Speaker (Planned)
In the framework of the European Synchrotron Radiation Facility (ESRF) upgrade program, a new nano-analysis beamline has been recently built on ID16 port(1). At 165m from the in-vacuum undulator source, ID16B endstation which offers a multimodal approach has been designed to accommodate several micro-analytical techniques (X-ray fluorescence, X-ray absorption, and X-ray diffraction) combined with 2D/3D X-ray imaging (XRI, such as magnified tomography and laminography). In this work, we present the in-situ nano-tomography set-up that has been developed to perform high temperature experiments. Thanks to different materials studies, the capabilities of the technique will be reviewed. Current challenges as well as future possibilities offered by the Extremely Brilliance Source upgrade program at the ESRF will be discussed. (1) G. Martínez-Criado, J. Villanova, R. Tucoulou, et al., ID16B: A hard X-ray nanoprobe beamline at the ESRF for nano-analysis. J. Synchr. Radiat., 23 (2015), p 344, 352.
||Planned: Supplemental Proceedings volume