|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||The John Cahn Memorial Symposium
||Thin Film Grain Growth for Twin Related Orientations of Grains
||John Blendell, Jean Taylor, John W Cahn, R. Edwin Garcia, Daniel J. Lewis
|On-Site Speaker (Planned)
More than 20 years ago Thangaraj and Dahmen (1992) produced Al films on (111) Si that contained only 3 twin related orientations. All grain boundaries were 30˚<100> tilt boundaries. Both symmetric and asymmetric triple junctions were observed. Cahn and Kalonji (1994) determined that there was a possibility of 7 different triple junctions. Recently we simulated the 2D growth of grains driven by surface curvature in such a system containing only three orientations. The nature of the growth was different as compared to the random orientations case. It was observed that the kinetics of growth were strongly influence by the grain boundary Wulff shape. For an isotropic Wulff shape the classical N-6 rule was observed. However, for a square or octagonal Wulff shape, grains with a large number of sides were stabilized. This may be a consequence of the grain growth due to topological changes. For example, neighbor switching does not occur, rather the grains merge into a larger grain. Also, grains tend to have an elongated structure and do not tend towards being equiaxed but there does not appear to be a tendency towards exaggerated growth.