|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Mechanical Behavior of Nanostructured Materials
||Exploring Nanoindentation Induced Stress Field Propagation in Nanoporous Thin Films
||Tyler Vanover, Nicolas Briot, Thomas John Balk
|On-Site Speaker (Planned)
Nanoindentation is a versatile technique that has been used extensively to probe the surface of bulk materials to obtain mechanical behavior data. Here, this technique is utilized to study the mechanical response associated with nanoporous (np) thin films of Si and Au with a variety of thicknesses. In this study, the authors explore the depth to which the stress field penetrates into the material and around the indenter tip by milling cross-sections of the indents with a focused ion beam and examining the compressed ligaments and densification effects. It has been realized that the np material is compressed and densified not only directly underneath the indenter, but also beyond the diameter of the indent. These results will be discussed in the context of how shallow the indents must be to prevent substrate effects from being incorporated into the resultant mechanical outputs.
||Planned: Supplemental Proceedings volume