|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||K-18: High-resolution Multi-modal Imaging Capability at the Hard X-ray Nanoprobe Beamline of NSLS-II
||Xiaojing Huang, Hanfei Yan, Evgeny Nazaretski, Mingyuan Ge, Petr Ilinski, Yong S Chu
|On-Site Speaker (Planned)
The hard X-ray nanoprobe (HXN) beamline at NSLS-II is a scanning probe microscope with a focused beam as small as 12 nm. While the sample is scanned across the focused beam, the fluorescence spectrum, the transmitted scattering pattern and Bragg diffraction signal can be recorded at each scan position. A series of images with various contrast mechanisms can be provided from a single scan, which gives a comprehensive picture of the sample under study. The HXN microscope provides the superb spatial resolution in the routine operation to investigate a great variety of sample systems, including material, biological and electrochemical specimen.
||Planned: Supplemental Proceedings volume