|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Materials Science for High-Performance Permanent Magnets
||Electronic States of Rare Earth Elements in Permanent Magnet Materials Probed by X-ray Magnetic Circular Dichroism Nano-Spectroscopy
||Tetsuro Ueno, Ai Hashimoto, Yasuo Takeichi, Kanta Ono
|On-Site Speaker (Planned)
Electronic state of 4f electrons of rare earth elements plays a crucial role in determining magnetic properties of rare-earth permanent magnet materials. In this study, we applied one of the most relevant X-ray technique, X-ray magnetic circular dichroism (XMCD) nano-spectroscopy using a scanning transmission X-ray microscope, to investigate 4f electronic states of various permanent magnet compounds. Highly focused X-rays enable us to probe tiny samples whose size of several micrometers square. Therefore, we can perform detailed spectroscopic analysis of single crystalline uniform samples extracted from polycrystalline bulk or powder-formed samples such as Sm2Fe17N3. Single crystalline samples were picked-up from actual magnets by microfabrication. X-ray absorption spectra and XMCD spectra were measured at the M4,5 edges of Sm for SmCo5, Sm2Fe17N3, Nd for Nd2Fe14B, NdFe11Ti, and Dy for (Nd,Dy)2Fe14B. Magnetic moments and valence states of rare earth elements will be compared among these compounds.