|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Late News Posters
||PP-43: Thermal Diffusivity & Conductivity Measurement of Very Thin and Highly Conductive Materials by the Laser Flash Technique
||Bob Fidler, Tony Thermitus, Juergen Blumm, Andre Lindemann, Martin Brunner
|On-Site Speaker (Planned)
Thermal conductivity and diffusivity are important thermophysical material parameters for description of heat transport properties of a material. For precise measurement of thermophysical properties like thermal diffusivity, the Laser Flash technique (LFA) is a fast and precise absolute method. However, the LFA technique has in the past been less effective in dealing with very thin, highly conductive specimens which require extremely short test times and very fast IR detector response. This poster describes new developments resulting in significant improvements for dealing with such materials by LFA. Ultra-fast sampling rate (up to 2 MHz) and extremely short pulse widths (up to 20 Ás) enables more accurate measurement of such materials. When testing metal (0.3 mm) and polymer foils (30 μm), for example, an optimum sampling rate and pulse width can now be selected. Also, a unique laser/light pulse mapping system now accounts for the finite pulse width effect and heat losses.