|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||How Important are the Smallest Grains for their Aggregate Mechanics?
||Tias Maiti, Philip Eisenlohr
|On-Site Speaker (Planned)
High Energy X-Ray Diffraction Microscopy (HEDM) is a nondestructive way of characterizing orientations, lattice strains, and grain morphology in polycrystalline materials. HEDM with near-field detector position is akin to tomography and therefore sensitive to grain shape but does not resolve lattice strains. The complementary far-field approach resolves lattice strains but only detects grain centers-of-gravity and relative sizes. Due to the overall diffracted intensity scaling with grain size, the population of smallest grains carries the largest uncertainty, in particular when using the far-field approach. To determine the influence of uncertainty in detecting smaller grains on the kinematic response of easier-to-detect large grains, Crystal Plasticity Fast Fourier Transform (CPFFT) full-field simulations of artificial microstructures with grain size distributions similar to experimental data but omitting fractions of small grains are statistically compared. The average response of larger grains is mostly insensitive to small ones.
||Planned: Supplemental Proceedings volume