About this Abstract |
Meeting |
2016 TMS Annual Meeting & Exhibition
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Symposium
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In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
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Presentation Title |
In-situ Micromechanical Testing Using Correlated 3-D X-ray and 2-D Electron Microscopy Analyses |
Author(s) |
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On-Site Speaker (Planned) |
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Abstract Scope |
The application of complementary characterization techniques has long been employed to provide a more thorough understanding of a material under study. Laboratory scale x-ray radiography and computed tomography analyses with submicron resolution can now be used to characterize the full volume of small-scale specimens that can also be characterized in the scanning electron microscope with nanometer spatial resolution. We report results of dynamic micromechanical tests being conducted in-situ while the x-ray and electron imaging analyses are being employed. These correlated experiments are carried out on individual composite and metallic specimens, first in the SEM and then within the x-ray system. High resolution surface analyses and submicron volumetric imaging can be carried out on a microspecimen held under similar states of dynamic loading. This yields valuable insight into the development of strain and damage within deforming specimens while also providing a quantitative correlation of surface displacements with underlying volumetric strain. |
Proceedings Inclusion? |
Planned: A print-only volume |