|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||The John Cahn Memorial Symposium
||A DSC Model for Grain Boundary Migration and Properties
||David J Srolovitz, Jian Han, Spencer Louis Thomas, Vaclav Vitek
|On-Site Speaker (Planned)
||David J Srolovitz
John Cahn and co-workers developed a predictive model for the coupling between stress and grain boundary (GB) migration that has since been validated by both atomistic simulation and experiment. In this presentation, we propose a generalization of this approach based on DSC disconnections. We demonstrate that the Cahn results represent a special case of the more general model. In particular, we will show how GB migration is coupled to a range of different driving forces, how GB migration can generate stress, and how these stresses can lead to switching between different GB migration mechanisms. The importance of these effects will be demonstrated by molecular dynamics simulation of the motion of individual GBs and within a polycrystal. We will then demonstrate the coupling between GB structure and the interactions between GB and plasticity (i.e., grain boundaries as barriers to dislocation motion and as sites for dislocation absorption, emission, and transmission). We briefly discuss how inclusion of thermal effects on GB structure can be related to GB roughening and GB sliding within the same model.