|About this Abstract
||Materials Science & Technology 2012
||Advances in Dielectric Materials and Electronic Devices
||Barium Zirconium Titanate Thin Films Studied by Scanning Probe Microscope
||Madhuparna Pal, Chonglin Chen, Ruyan Guo, Amar S Bhalla
|On-Site Speaker (Planned)
Scanning probe microscopy (SPM) has been utilized as an important tool in the field of nanoscience for material characterization at nanoscale level. Thin film samples of Barium Zirconium Titanate were studied using the SPM for their surface roughness, microstructure and grain size. Barium Zirconium Titanate of different compositions (Zr:Ti ratio) was synthesized on lanthanum aluminate oxide substrate and annealed at 1100° C. The microstructure of Ba(Zr0.05Ti0.95)O3, Ba(Zr0.08Ti0.92)O3, Ba(Zr0.12Ti0.88)O3 and Ba(Zr0.15Ti0.85)O3 were observed and compared with respect to their grain size. The sample Ba(Zr0.20Ti0.80)O3 was tested for ferroelectric field induced domain switching at numerous local points. It is found that not all local areas are totally switchable. Phase reversal (on a qualitative basis) was seen with the reversal of the applied voltage. This paper also reports piezoelectric force microscopy (PFM) study of the nano-structural piezoelectric and ferroelectric Ba(Zr0.20Ti0.80)O3 film at temperatures far above its ferroelectric phase transition.