|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Phase Transformations and Microstructural Evolution
||F-82: Application of ASTAR/PED Orientation Microscopy Technique in Grain Boundary Character Distribution of Nano-size Pure Zirconium
||Iman Ghamarian, Peyman Samimi, Gregory Rohrer, Peter Collins
|On-Site Speaker (Planned)
Recently, research efforts have directly incorporated the characteristics of the grain boundaries, including the five orientation parameters (three for the misorientation made by the grain boundary in Euler space and two for the normal of the grain boundary plane in spherical coordinate). In order to properly characterize these parameters, it is necessary to conduct orientation microscopy. Further, when the counting statistics of grain boundary character are sufficient (i.e., >100,000 grain boundaries), it allows for additional aspects (e.g., grain boundary energy) of the material to be understood. While some work has been conducted on coarse grained materials, little work has been conducted on ultrafine grained materials. In this research, grain boundary character distributions of nano-size pure zirconium deposited by PVD on a fused silica was studied using a TEM-based orientation imaging microscopy technique, ASTAR/precession electron diffraction, which enables orientation studies with a spatial resolution of a few nanometers.
||Planned: Supplemental Proceedings volume