|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Deformation and Transitions at Interfaces
||Imaging and Analyzing Slip in Three Dimensions
||Rulin Chen, Jonathan Lind, Reeju Pokharel, David Menasche, Anthony Rollett, Robert M Suter
|On-Site Speaker (Planned)
||Robert M Suter
Precise, non-destructive measurements of lattice orientation in three dimensions are used to image rotations associated with slip events during plastic deformation of polycrystals. These rotations form low angle interfaces within what were previously virtually perfect crystalline grains. Near-field High Energy Diffraction Microscopy has been used to perform such measurements on materials including hexagonal zirconium and cubic copper. In hexagonal materials, it is straightforward to pick out intra-granular rotations corresponding specific slip systems and to characterize the variations in rotation axis and angle corresponding to individual events. Furthermore, the degree to which these rotations occur on expected crystallographic planes and the variations in the above quantities within these planes can be characterized. This talk will contrast behavior observed in hexagonal materials with characterizations in copper. The results of this analysis can be used to inform models of polycrystal plasticity.