| About this Abstract |
| Meeting |
Materials Science & Technology 2011
|
| Symposium
|
Interfaces, Grain Boundaries and Surfaces from Atomistic and Macroscopic Approaches -- Fundamental and Engineering Issues
|
| Presentation Title |
Atomic Imaging and Spectroscopy on Interfaces and Grain Boundaries Using an Aberration Corrected Transmission Electron Microscope |
| Author(s) |
Bert H Freitag, Joerg Jinschek, Dmitri Klenov |
| On-Site Speaker (Planned) |
Bert H Freitag |
| Abstract Scope |
In this contribution atomic imaging with HR-STEM, atomic mapping using EELS and EDS and focus series reconstruction in HR-TEM are presented. Examples in STEM imaging of interfaces using ABF and HAADF imaging are given. The interface of LaAlO3/SrTiO3 and BaTiO3/SrTiO3 are examined in its chemical composition atom column by atom column using EELS spectroscopy. On various materials like GaAs, InP chemical mapping on the atomic level with a resolution of well below 0.2nm using X-ray spectroscopy are presented showing the progress obtained by the combination of a high sensitive new EDS detector and a probe Cs-corrector in EDS microanalysis. In quantitative HR-TEM using FSR at 80kV the atomic 3D structure of a single and double graphen sheet is determined. In the phase image of the reconstructed complex exit wave the position of carbon atoms on the top and bottom layer can be distinguished in the change in electron phase. |
| Proceedings Inclusion? |
Definite: A CD-only volume |