|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Recent Development of Full-field X-ray Microscope at NSLS-II - A Case of Battery Research
||Mingyuan Ge, David Scott Coburn, Evgeny Nazaretski, Kazimierz J. Gofron, Huijuan Xu, Weihe Xu, Zhijian Yin, Wah-Keat Lee
|On-Site Speaker (Planned)
Full field transmission X-ray microscope (TXM) is a powerful technique for non-destructive 3D imaging with nanometer-scale spatial resolution. Recently, a newly designed TXM beamline (FXI) was commissioned at NSLS-II at Brookhaven National Lab. One specialty of this TXM is the capability of doing fast tomography. Recently, we demonstrated a one-minute 3D nano tomography with sub-50 nm resolution, which represents more than an order of magnitude increase in the time resolution available for studying sample dynamics at 10s of nm scale. In this talk, we will present applications of TXM into studies of the dynamics of energy material. For example, we will show recent results on the in-situ investigation of material structure evolution during a lithium-ion battery operation.
||Planned: Supplemental Proceedings volume