| About this Abstract |
| Meeting |
2019 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Materials through High Resolution Imaging
|
| Presentation Title |
STEM Diffraction Contrast Image Simulations for Complex Dislocation Configurations |
| Author(s) |
Joseph Tessmer, Saransh Singh , Marc De Graef |
| On-Site Speaker (Planned) |
Joseph Tessmer |
| Abstract Scope |
Simulation methods, including molecular dynamics (MD) and discrete dislocation dynamics (DDD), are used to study dislocation behavior in crystalline materials. Of particular interest are complex dislocations, whose displacement fields cannot be represented in closed-form expressions. The results of these simulations can be represented as 2D or 3D models, in addition to statistical data. Experimental studies of dislocation behavior are often performed via Scanning Transmission Electron Microscopy - Defect Contrast Imaging (STEM-DCI). Direct comparison of the results of these STEM-DCI images and the output of dislocation simulations is often complicated by the fact that experimental images only approximately represent the true object due to dynamical scattering events in the microscope. Therefore, a model for STEM-DCI images of the results of MD and DDD simulations will enable more direct comparison of experimental and simulated results. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |