|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Phase Transformations and Microstructural Evolution
||In Situ Characterization and Phase Field Modeling of Irradiation-Induced Grain Growth
||Daniel Bufford, Fadi Abdeljawad, Stephen Foiles, Khalid Hattar
|On-Site Speaker (Planned)
Nanostructured metals have been shown to have exceptional mechanical and radiation properties, but are often limited by interfacial or grain boundary stability. Determining the role of grain orientation and boundary character is essential in predicting material properties and ensuring long term microstructural stability. TEM precession-assisted electron diffraction orientation mapping was utilized to better understand the nature of radiation-induced grain growth and boundary migration in an archetype nanocrystalline Au system. Images and orientation maps were collected before and after in situ ion irradiation TEM with 10 MeV Si. Experimentally collected orientation maps were directly used as structural input for a phase field grain growth model. Controllable model parameters for grain boundary energy, width, and mobility were varied to better understand the effects of these parameters on microstructural evolution. By directly combining experimental and modeling techniques, improved model validation and better understanding of the nanometer resolution experimental results is now possible.
||Planned: A print-only volume