|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||Determination of the Five Parameter Grain Boundary Character Distribution of Nanocrystalline Alpha-zirconium Thin Films Using Transmission Electron Microscopy
||Iman Ghamarian, Peyman Samimi, Gregory Rohrer, Peter Collins
|On-Site Speaker (Planned)
Grain boundary engineering and other fundamental materials science problems (e.g., phase transformations and physical properties) require an improvement in the understanding of the type and population of grain boundaries in a given system. One way to rapidly obtain databases to analyze is to use small-grained materials and high spatial resolution orientation microscopy techniques, such as ASTAR™/precession electron diffraction. To demonstrate this, a study of grain boundary character distributions was conducted for alpha-zirconium deposited at room temperature on fused silica substrates using physical vapor deposition. The orientation maps of the nanocrystalline thin films were acquired by the ASTAR™/precession electron diffraction technique, a new transmission electron microscope based orientation microscopy method. The reconstructed grain boundaries were classified as pure tilt, pure twist, 180°-twist and 180°-tilt grain boundaries based on the distribution of grain boundary planes with respect to the angle/axis of misorientation associated with grain boundaries.
||Planned: None Selected