|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Applications of Low(er) Voltage EBSD to Heavily Deformed Material Systems
||Farangis Ram, Marc De Graef
|On-Site Speaker (Planned)
Traditionally, EBSD experiments are performed at a microscope accelerating voltage of 20 to 30 kV; this sets the size of the interaction volume (i.e., the volume from which the backscattered electrons or BSEs are emitted) and thus the spatial resolution attainable in the orientation maps. Lower voltage (10 kV or less) observations lead to improved spatial resolution, but for most EBSD cameras also a decreased efficiency, making accurate indexing more difficult. Using the newly developed dictionary indexing approach, we will show that low voltage EBSD patterns can still be indexed accurately, opening the way to quantitative analysis of orientations in highly deformed materials, at a high spatial resolution. Examples will include shot-peened aluminum, for which a large 10 kV data set (about 3.4 million patterns) with a sampling step size of 25 nm was indexed successfully all the way to the recrystallized layer at the shot-peened surface.
||Planned: Supplemental Proceedings volume