|About this Abstract
||Materials Science & Technology 2011
||Recent Advances in Structural Characterization of Materials
||A Novel Multi-Modal 3D Characterization System to Quantify Grain-Level Microstructural Features in Macro-Scale Volumes
||Michael Uchic, Michael Groeber, Megna Shah, Adam Shiveley, Jonathan Spowart
|On-Site Speaker (Planned)
In order to rapidly quantify grain-level microstructures in structural alloys, a first-of-its-kind system is being assembled to characterize the 3D microstructure, texture and chemistry of volumes ranging from 1 mm<SUP>3</SUP> to 1 cm<SUP>3</SUP>. The system performs 3D characterization via serial sectioning, and is comprised of three primary subsystems: Tescan Vega SEM outfitted with Bruker Quantax EDS and EBSD detectors, UES RoboMet.3D robotic serial sectioning system, and a 6-axis robot to perform sample manipulation. The incorporation of crystallographic and chemical maps into 3D characterization systems has been previously realized on FIB-SEMs, however, these devices can only interrogate miniature volumes. Importantly, the use of both EBSD and EDS data allows for more accurate and robust procedures to automatically classify key microstructural features compared to traditional image-based analysis. The associated presentation will highlight system capabilities, discuss methods used to automate data collection, and present initial results from the characterization of Ni superalloy microstructures.
||Definite: A CD-only volume