| About this Abstract |
| Meeting |
Materials Science & Technology 2009
|
| Symposium
|
Characterization and Modeling of Ceramic-Ceramic and Metal-Ceramic Interfaces
|
| Presentation Title |
Size Dependent Properties of Interfaces |
| Author(s) |
Dawn Bonnell |
| On-Site Speaker (Planned) |
Dawn Bonnell |
| Abstract Scope |
Emerging technologies for energy harvesting, post CMOS devices, flexible electronics, all involve electrical interfaces. At small scales interfaces become critically important to device behavior. Yet probing the properties of interfaces with nm dimensions is extremely challenging. An approach for quantifying the properties of metal/oxide interfaces that is based on scanning probe microscopy will be described. Since commercial instrumentation (either probe stations or scanning probe control systems) do not provide this capability, a custom built local impedance probe is developed. This capability is used to characterize the size dependence of metal/semi conducting oxide surfaces. Examples include Cu on TiO2 (110) and Au on SrTiO3 (100) with size ranges from 1nm to 100nms. The origin of the size dependent behavior will be discussed and generalized to a range of possible interfaces. |
| Proceedings Inclusion? |
Undecided |