|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||High Throughput Nano-size Precipitates Characterization of Steels with Unprecedented Statistics: Transmission Kikuchi Diffraction on Extraction Replicas
||Arunodaya Bhattacharya, Chad Parish, Jean Henry, Ying Yang, Lizhen Tan, Yutai Katoh
|On-Site Speaker (Planned)
High statistics in characterizing precipitates/secondary phases in steels/alloys using electron microscopy remains a grand challenge. We reveal that differing phases of nano-size precipitates can be mapped with unprecedented statistics using transmission Kikuchi diffraction (tKD) on typical specimens like extraction replicas. Using a case study of a new version of Eurofer-97 RAFM steel we show that tKD successfully identified more than thousand M23C6/M7C3/MX/M2X precipitates as small as 5-10 nm in a single scan; something that is currently unachievable and unimaginable using transmission electron microscopy (TEM). tKD indexing was verified using high-resolution TEM and convergent beam electron diffraction (CBED). We also highlight that combining tKD with state-of-art analytical electron microscopy and modern data analytics provide complete crystal structure-chemistry identification at nano-scale in automated way, hence opening pathways for big data material characterization for advanced materials development.
Work supported by US-DOE, Office of Science, Fusion Energy Sciences, under contract number DE-AC05-00OR22725 with UT-Battelle.
||Planned: Supplemental Proceedings volume