|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||In-situ Methods for Unraveling Structure-Property Relationships in Light Metals
||In-situ X-ray Synchrotron Profile Analysis during High Pressure Torsion of Ti
||Erhard Schafler, Michael Bernhard Kerber, Florian Spieckermann, Torben Fischer, Roman Schuster, Cornelia von Baeckmann
|On-Site Speaker (Planned)
X-Ray Line Profile Analysis is a powerful method to characterize the microstructure of deformed materials, especially when high energy and brilliant Synchrotron radiation enables investigations with high time and spatial resolution. Parameters like dislocation density, dislocation arrangement as well as scattering domain size and it's distribution are parameters of a physical model of peak broadening, which can be applied to high quality diffraction measurements. A small sample high-pressure-torsion-machine was designed in order to perform in-situ diffraction experiments during the deformation process at hydrostatic pressures up to 8GPa in order to follow the strain as well as pressure induced microstructural characteristics of any material deformed. This was possible with the ideal design and equipment at the High-Energy-Materials-Science-beamline at PETRA III in Hamburg. Recent and first results of experiments on HPT-deformed Ti are presented.