| About this Abstract |
| Meeting |
MS&T21: Materials Science & Technology
|
| Symposium
|
ACerS Robert B. Sosman Award Symposium: Bridging the Gap between Atomistic and Continuum Approaches to Interface Science
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| Presentation Title |
Atomic Structure of Two Phases of a Cu Tilt Grain Boundary Resolved by Scanning Transmission Electron Microscopy |
| Author(s) |
Gerhard Dehm, Thorsten Meiners, Jazmin Duarte, Timofey Frolov, Christian Liebscher |
| On-Site Speaker (Planned) |
Gerhard Dehm |
| Abstract Scope |
Bulk phases and their transformations play a key role in the design of materials. In nanocrystalline materials and thin films the abundance of grain boundaries opens an additional route to tailor properties via segregation and/or grain boundary phase transitions. In this presentation, we report on grain boundary segregation and grain boundary phase transformation in Cu thin films studied by aberration corrected scanning transmission electron microscopy. Atomic resolved imaging of a Sigma 19b grain boundary revealed novel grain boundary structures and unexpectedly the coexistence of two different atomic motifs indicating the coexistence of two grain boundary phases. The two grain boundary structures are separated by a line defect. The experimental observations are discussed and compared to molecular dynamic simulations.
Acknowledgement: Financial support by the ERC Advanced Grant GB CORRELATE (Grant Agreement 787446 GB-CORRELATE) is gratefully acknowledged. |