|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||In-situ Monitoring of Cyclic Deformation by High Resolution Reciprocal Space Mapping
||Annika Diederichs, Ulrich Lienert, Henning Friis Poulsen, Wolfgang Pantleon
|On-Site Speaker (Planned)
Microstructure analysis of cyclically deformed structures has earlier been impeded by limitations in the availability of characterization techniques allowing non-destructive analysis of the microstructural evolution during deformation in macroscopic samples. High resolution reciprocal space mapping with high energy synchrotron radiation providing large penetration depths is applied to monitor the microstructure evolution in individual grains embedded in an aluminium polycrystalline bulk sample in-situ during loading with a resolution in reciprocal space of 10^-4. Individual subgrains can be identified by their characteristic intensity distribution and followed during ongoing deformation such as loading in both tension and compression, continuous cycling or during individual load cycles while monitoring macroscopic stress and strain simultaneously. Important information such as orientation, size, stresses and strains of grains and subgrains can be extracted helping towards a deeper understanding of the microstructural evolution at the subgrain and grain level and its influence on material properties.
||Planned: Supplemental Proceedings volume