|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Frontiers in Advanced Functional Thin Films and Nanostructured Materials
||Kinetic Modeling of the Structural Transition in VO2 Thin Films
||Adele Moatti, Ritesh Sachan, John Prater, Jagdish Narayan
|On-Site Speaker (Planned)
For a long time, VO2 single crystals were believed to undergo structural and electronic phase transitions simultaneously. There has been, also, a controversy whether Mott or Peierls is responsible for these transitions. However, in thin films in the presence of unrelaxed strains, structural (Peierls) and electronic (Mott) transitions are affected differently, and are separated. In this paper, we have studied structural transition by temperature-dependent X-Ray diffraction measurements, and electronic transition by resistance measurements in epitaxially grown vanadium dioxide films on c-sapphire substrates. The onset of structural transition postponed by 3o from electrical transition. These results are discussed using a joint kinetic and thermodynamic approach, where the velocity of phase transformation is controlled largely by kinetic, and the formation of intermediate phases is governed by thermodynamic considerations. With this study, we suggest that the manipulation of structural and electrical transitions is possible by varying the transition activation barrier through strain engineering.
||Planned: Supplemental Proceedings volume