|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XVII
||K-15: The Electromigration Effect Revisited: An In Situ SEM and SR-based XRD Study
||Yu-chen Liu, Shih-kang Lin
|On-Site Speaker (Planned)
Electric current induced diffusion is termed electromigration (EM) effect. The mechanism is generally accepted as momentum transfer between the ions and electrons. It well explained directional effect including the voids/hillocks formation, and polarity effect induced by electric current; however, it failed to explain the non-directional effect such as the supersaturation effect and non-polarity effect. In this study, in situ scanning electron microscopic (SEM) equipped with electron backscattering diffraction (EBSD), in situ synchrotron radiation-based X-ray diffraction (SR-based XRD), and first principle calculation are employed to revisit the mechanism of EM effect. The result shows that the electric current behaves similarly with the conventional solid mechanics. A yield point exists for the EM occurrence. The voids/hillocks will form at the plastic deformation region and the Schmid’s Law could be invoked to explain the formation. The study provides a new insight to the EM effect.
||Planned: Supplemental Proceedings volume