|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XVII
||Electric Current-induced Slip/Twin Transition: An In Situ EBSD Study
||Yu-chen Liu, Shih-kang Lin
|On-Site Speaker (Planned)
Our recent study revealed that electromigration (EM) effect occurs at the condition beyond a yield strain induced by electron flows. The electric current-induced deformation could be analyzed based on the conventional solid mechanics. Herein, in situ electron backscattered diffraction (EBSD) is performed to study the crystallography and morphological evolutions of Cu strips under electric currents. At the current density of 4.2 × 10^5 A/cm^2, twining deformation accompanied with the formation of hillocks is observed, while only hillocks formation is found at 3.4 × 10^5 A/cm^2. The Schmid’s Law is introduced to manifest twin boundaries and hillocks form at the regions with higher Schmid factor along the twin and slip system, respectively. The analysis reveals the hillocks formation is a plastic deformation by means of slip. The result clearly shows that electric current would induce the slip/twining transition, and the conventional solid mechanics theory can be invoked to study EM-induced failure.
||Planned: Supplemental Proceedings volume