|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||3D Mapping of Subgrains with High Resolution 3DXRD
||Mustafacan Kutsal, Marta Majkut, Can Yildirim, Phil Cook, Yubin Zhang, Jon Wright, Carsten Detlefs, Henning Friis Poulsen
|On-Site Speaker (Planned)
3D characterization of deformation microstructures is a key challenge in metallurgy. Upon deformation, dislocations are accumulated in microstructure to accommodate the exerted macroscopic strain. These dislocations arrange themselves to form subgrains of 100 nm to 2 μm. In this study, we present a new modality of three-dimensional x-ray diffraction (3DXRD), called high-resolution 3DXRD (HR-3DXRD), where crystalline domains of submicron size can be mapped non-destructively. In order to obtain resolution in sub-micron range, diffraction spots are acquired with a HR 2D detector. This detector translated such that its center traces the Debye rings of Bragg reflections. Diffraction images acquired at each position are stitched to obtain virtual detector images with a very high FOV/resolution ratio.3DXRD type reconstruction software applies to these images. Hence, mosaic spread and strain of the subgrain structure can be determined. We present results of demonstration experiments at ESRF beamlines ID11 and ID06 on industrially relevant samples.
||Planned: Supplemental Proceedings volume