|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||HRTEM Analysis of Crystallographic Defects in Cd-Zn-Te Single Crystals
||Eren Yunus Kalay, Yasin Ergunt, Merve Pinar Kabukcuoglu, Mehmet Parlak, Rasit Turan, Bengisu Yasar
|On-Site Speaker (Planned)
Single crystalline CZT is a leading material for room-temperature radiation detectors used in astronomy, medicine, and homeland security. State-of-the-art bulk single crystal growth techniques have been developed since the first synthesis of CdZnTe but still CZT detectors suffer from various crystallographic defects formed either during crystal growth or post-growth cooling processes. In this respect, we analyzed the crystallographic defects commonly observed in CZT single crystals using high-resolution electron microscopy (HRTEM) and model the corresponding image simulations. Single crystalline Cd1-x ZnxTe crystals, with x = 0.5, were grown using a three-zone vertical Bridgman system. Single crystalline regions were identified by electron back-scattered diffraction (EBSD). Focused-ion beam (FIB) is used to prepare TEM foils. HRTEM revealed linear defects along <211> directions embedded in single crystalline matrix. Accordingly, Tellurium precipitate with monoclinic and hexagonal crystal structures, nano-twins and stacking fault defects were modelled and quantitatively compared with experimental HRTEM images.
||Planned: A print-only volume