|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Detection of the Onset of Plasticity in Micro-crystals: In-situ Deformation of InSb Micro-pillars under Synchrotron Coherent X-ray Nanobeam
||Ludovic Thilly, Vincent Jacques, Christoph Kirchlechner
|On-Site Speaker (Planned)
Coherent x-ray micro-diffraction was used to detect and count phase defects (stacking faults, SFs, left in the crystal after the glide of partial dislocations) preliminarily introduced by deformation of InSb single-crystalline micro-pillars. Diffraction patterns were recorded by scanning the coherent nanobeam along the pillars axis: peak splitting is observed in the diffraction pattern associated to the top region, in agreement with the presence of SFs located in the upper part of the pillars. Simulations of coherent diffraction patterns were also performed considering SFs randomly distributed in the illuminated volume: they show that not only the number of defects but also the size of the defected volume influences the maximum intensity of the pattern, allowing for a precise counting of defects [PRL, 111 (2013), 065503].
Recently, diffraction measurements were performed in-situ, during compression, to detect the first lattice defects, i.e. the first events of the plastic deformation appearing in InSb micro-pillars.
||Planned: Supplemental Proceedings volume