|About this Abstract
||Materials Science & Technology 2012
||In-situ Characterization of Phase Transformations in Materials
||Full Field Mapping of Microstructural Changes during Superelastic Deformation
||Michael G. Kimiecik, J. Wayne Jones, Samantha Daly
|On-Site Speaker (Planned)
||Michael G. Kimiecik
A novel method to capture and characterize a full-field, quantitative displacement map on the length scale of the material microstructure under in situ mechanical deformation has been developed. This is accomplished by combining in-situ scanning electron microscopy (SEM) and post-processing of images using commercial digital image correlation (DIC) software integrated with a custom distortion correction code to remove both the spatial and temporal distortions associated with SEM imaging. A specialized sample patterning and image capture technique has been developed to enable sub-micron resolution of surface displacements, and the subsequent mapping of localized strain gradients in relation to microstructural features. The use of these techniques to examine the progressing transformation front of a superelastic shape memory alloy (SMA) as it undergoes in situ mechanical loading will be described. The interaction of the phase transformation front with microstructural features, including grain boundaries and orientations, will also be addressed.