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Meeting 2019 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Imaging
Presentation Title Hard X-ray Coherent Diffraction Imaging Using Nanoscale Focusing Optics
Author(s) Martin Victor Holt
On-Site Speaker (Planned) Martin Victor Holt
Abstract Scope Although sometimes viewed as ancillary to the development of lensless phase retrieval techniques in x-ray coherent diffraction imaging methodology, the recent use of sub-30nm nano-focusing optics in ptychographic imaging has been shown to be highly complementary to full-field iterative methods by enabling several key experimental modalities in both transmission and Bragg geometries. Specifically, nano-focussing microscopy enables correlative experiments with inelastic direct space scattering measurements, fixed-angle three dimensional structural ptychography in Bragg geometry, as well as robust two dimensional iterative phase retrieval with increased tolerance to nanoscale phase heterogeneity and removal of isolation constraints. The benefits and drawbacks of the use of direct space sub-30-nm hard x-ray beams in coherent diffraction microscopy methods will be discussed in the context of recent results.
Proceedings Inclusion? Planned: Supplemental Proceedings volume

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

3D Mapping of Subgrains with High Resolution 3DXRD
A Fast Algorithm for Improving Reconstruction Quality with Incomplete Tomography Data
Advances in Fatigue Crack Growth Characterization via In Situ Phase Contrast Tomography Imaging
Coherent Diffraction Imaging at High X-ray Energies
Computational Investigation of Limits of Bragg Coherent Diffraction Imaging
Deep Learning of Inverse Problems in Scanning Transmission Electron Microscopy/Scattering
Deep Neural Networks for Feature Extraction and Image Reconstruction from Coherent X-ray Diffraction Imaging Data
Deformation Behavior of Functionally Graded Polymeric Foams Using X-ray Tomography
Direct Observation of Point to Parallel Array Cu GB Segregation Behavior in Al Alloy 7075
Examining Dzyaloshinskii Domain Walls in Asymmetric Pt/Co/Ni/Ir Superlattices Using Lorentz TEM
Exploring Ion-irradiation Damage Using Bragg Coherent X-ray Imaging and 3D Transmission Electron Microscopy
Hard X-ray Coherent Diffraction Imaging Using Nanoscale Focusing Optics
High Throughput Nano-size Precipitates Characterization of Steels with Unprecedented Statistics: Transmission Kikuchi Diffraction on Extraction Replicas
Identification and Visualization of Chemical Outliers through Scientific Data Mining in Nanoscale Spectro-microscopic Study of NMC Electrode
In Situ Loading of Engineered Materials during X-ray 3D Tomographic Imaging
Investigation of Helium Precipitates in Ta(Ti)/Zr(Ti) Composites Made by Solid Metal Dealloying
K-18: High-resolution Multi-modal Imaging Capability at the Hard X-ray Nanoprobe Beamline of NSLS-II
Learning CDI Reconstructions with Backpropagation
Materials Characterisation via Optical Ptychographic Imaging: Principles and Applications
Measurements of Irradiation Induced 3D Strain Field at the Nanoscale with X-ray Bragg Coherent Diffraction Imaging
Multi-angle Bragg Projection Ptychography with Probe Retrieval
Multi-modal 3D Imaging of LiNi1-x-yMnxCoyO2 Cathode Material with Concentration-gradient
Multi-reflection Bragg Coherent Diffractive Imaging of Real-world Materials Samples
Multimodal Imaging Using Hard X-ray Speckle
Photoelastic Ptychography for Anisotropic Imaging of Optically Transparent Samples
Recent Development of Full-field X-ray Microscope at NSLS-II - A Case of Battery Research
Revealing the Growth Dynamics of Nature’s Forbidden Crystals
Sparse Dictionary Learning Methods for Coherent X-ray Diffractive Imaging
STEM Diffraction Contrast Image Simulations for Complex Dislocation Configurations
Three-dimensional Imaging of Vortex Phases in Ferroic Materials
Ultrahigh-speed X-ray Imaging for Studying Materials Structure Dynamics
Understanding Catalyst Complexity at Synchrotron Light Sources Using Hard X-ray Ptychography and Tomography
X-ray Coherent Surface Scattering Imaging for Surface 3D Imaging and Material Characterization

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