| About this Abstract |
| Meeting |
2019 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2019)
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| Symposium
|
2019 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2019)
|
| Presentation Title |
Dynamic Defect Detection in AM Parts Using FEA Simulation |
| Author(s) |
Kevin Johnson, Jason Blough, Andrew Barnard, Aimee Allen, Ben Brown, Troy Hartwig, David Soine, Tristan Cullom, Edward Kinzel, Douglas Bristow, Robert Landers |
| On-Site Speaker (Planned) |
Kevin Johnson |
| Abstract Scope |
The goal of this paper is to evaluate internal defects in AM parts using FEA simulation. The resonant frequencies of parts are determined by the stiffness and mass involved in the mode shape at each resonant frequency. Voids in AM parts will change the stiffness and mass therefore shift the resonant frequencies from nominal. This paper will investigate the use of FEA to determine how much a void size, shape, and location will change the resonant frequencies. Along with where the optimal input and response locations are in order to find these frequency changes. The AM part evaluated in this work includes a common bracket evaluated individually and as a set of parts that are still attached to the build plate. This work was funded by the Department of Energy’s Kansas City National Security Campus which is operated and managed by Honeywell Federal Manufacturing Technologies, LLC under contract number DE-NA0002839. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |