|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Phase Transformations and Microstructural Evolution
||Microstructural Evolution of Nickel during Multiple Annealing Stages from Three-dimensional X-ray Microscopy
||Aditi Bhattacharya, C.M. Hefferan, S.F. Li, J. Lind, Yufeng Shen, R.M. Suter, G.S. Rohrer
|On-Site Speaker (Planned)
High purity polycrystalline Nickel was annealed at 800 °C and measurements were taken at five different points in time separated by 30 minute intervals. Near-field High Energy X-ray Diffraction Microscopy (nf-HEDM), a non-destructive, synchrotron based 3D characterization technique was used to track the microstructural evolution of nearly 2500 grains. The temporal change in crystallographic orientation and misorientation in the microstructure was measured over the different anneal states. Using grain orientation, size and location as criteria, each grain was matched and tracked over the course of the 5 anneal states. After matching them, grain volumes, numbers of neighboring grains and changes in these parameters over time were quantified. The results were compared to established theories of grain growth.
||Planned: Supplemental Proceedings volume