|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Direct Measurement of Critical Resolved Shear Stress Values in a Mg Alloy by In Situ 3D-XRD
||Leyun Wang, Zhonghe Huang, Sangbong Yi, Jun-Sang Park, Alireza Maldar, Xiaoqin Zeng
|On-Site Speaker (Planned)
Critical resolved shear stress (CRSS) of various slip modes are important input parameters for crystal plasticity modeling of Mg alloys. In this presentation, a method to determine the CRSS values in a Mg-Y alloy using the three dimensional X-ray diffraction (3D-XRD) technique will be demonstrated. The material was prepared by rolling and annealing to achieve an average grain size of 40 microns. A tensile specimen was incrementally loaded at Beamline 1-ID at APS up to 3% engineering strain, with the 3D-XRD setup to track the evolution of individual grains, including their crystal orientation, center of mass, and stress tensor. By analyzing orientation rotation and stress evolution in individual grains, it is possible to determine the activated slip systems and measure their CRSS. The obtained average CRSS values for various slip modes are used in a viscoplastic self-consistent (VPSC) model, which successfully simulates the stress-strain behavior of this material.
||Planned: Supplemental Proceedings volume