|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||GAT-2017 (Gamma Alloys Technology - 2017)
||Three Dimensional Reconstruction of TiAl Microstructures
||Henry Proudhon, Anouk Briane, Nicolas Gueninchault, Wolfgang Ludwig, Jerome Crepin, Lionel Marcin, Jean-Charles Stinville, McLean P Echlin, Tresa M Pollock
|On-Site Speaker (Planned)
Diffraction Contrast tomography (DCT) is a powerful non destructive near field X-ray technique to probe bulk cristalline materials. DCT allows to retreive the 3D grain map of millimeter sized specimens with a spatial resolution close to the micrometer. It has been used succesfully in the past to image a variety of materials and works well with rather equiaxed and undeformed mirostructures. Here, more complex TiAl microstrutures, including full gamma and duplex, are investigated. The slighly tetragonal structure of the L10 phase and the twin relationships are taken into account to improve the reconstructions and achive 3D grain maps in TiAl samples. Progress and challenges of the technique with complex microstructure of engineering materials will be detailed. Finally, the first results of destructive 3D characterization with the UCSB Tribeam system (large scale EBSD serial sectioning) of the same samples imaged earlier by DCT will be presented.
||Planned: Stand-alone book in which only your symposium’s papers would appear (indicate title in comments section below)