About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Deformation Mechanisms, Microstructure Evolution, and Mechanical Properties of Nanoscale Materials
|
Presentation Title |
Understanding Deformation Mechanisms in Ultrafine Grained Thin Films by Quantitative In Situ TEM Deformation |
Author(s) |
Josh Kacher |
On-Site Speaker (Planned) |
Josh Kacher |
Abstract Scope |
Ultrafine grained thin films exist in a mechanistic gray area where both grain boundary and transgranular dislocation activity play important roles in accommodating plasticity. Quantitative in situ transmission electron microscopy (TEM) deformation experiments provide direct resolution of deformation processes while simultaneously recording stress and strain information. In this talk, I will discuss the application of a custom MEMS-based quantitative deformation platform for in situ TEM testing of ultrafine grain Al and Au thin films. Discussion will focus on the influence of microstructural character, such as grain size, orientation, and grain boundary characteristics, on the active deformation mechanisms. Special attention will be given to grain boundary mediated deformation via grain boundary sliding and disconnection activity. The ability to measure variations in activation volume as a function of material characteristics and environment will be demonstrated through testing of irradiated samples and electron beam effects during deformation. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Mechanical Properties, Thin Films and Interfaces |