|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||LL-86: Synchrotron X-Ray Characterization of Inconel 625 Manufactured Through Direct Metal Laser Sintering Technique of Additive Manufacturing
||Yaakov Idell, Lyle Levine, Andrew Allen, Fan Zhang, Carelyn Campbell
|On-Site Speaker (Planned)
Through the use of high-brilliance synchrotron X-rays from an undulator source, we are able to provide unparalleled results monitoring microstructural evolution of Inconel 625 built through the additive manufacturing technique of direct metal laser sintering using in-situ annealing ultra-, small-, and wide-angle X-ray scattering with temperatures up to 1150 °C and microLaue X-ray diffraction synchrotron experiments. With a Bonse-Hart double crystal configuration, USAXS/SAXS/WAXS is sensitive to feature sizes over a three decade range from just below 1 nm to just above 30 µm; meanwhile, the microbeam XRD uses a depth-resolved focused sub-micron beam providing stress tensor measurements from sub-micron volumes. Along with complementary TEM, EBSD, and lab-based XRD experiments, we were able to determine local residual stress distributions, porosity, phase fractions, and compositional differences. These results are compared with multicomponent diffusion simulations that predict phase fraction and composition as a function of time and temperature.
||Planned: A print-only volume