|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Thermal and Mechanical Stability of Nanocrystalline Materials
||The Effect of Free Volume and Interfacial Junctions on the Stability of Nanocrystalline Structures
||GŁnter Gottstein, Lasar S. Shvindlerman
|On-Site Speaker (Planned)
The presentation will address the impact of interfacial structural elements like grain boundaries and grain boundary junctions on grain growth in nanocrystalline materials in particular with respect to Zener drag and excess free volume effects.
A general Gibbs-Thomson equation which also accounts for the excess free energy of the grain boundary - phase boundary junction reveals that the equilibrium shape of an inclusion (particle or void) strongly depends on the inclusion size. In this context the influence of the line tension of triple junctions on the nucleation energy barrier of precipitation at grain boundaries and the influence of the particle- boundary triple line on Zener drag will be discussed.
Defects are associated with an excess volume, which will be released upon annihilation of the defects. A study of the impact of the excess free volume of grain boundaries on grain growth kinetics of nanocrystalline materials will be presented.
||Planned: Supplemental Proceedings volume