|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Using Correlative HRDIC, EBSD and ECCI to Answer Questions of Microstructure-specific Plasticity
||Allan Harte, Alistair Garner, Alberto Orozco-Caballero, João Quinta da Fonseca, Michael Preuss
|On-Site Speaker (Planned)
High-resolution digital image correlation (HRDIC) is quickly becoming an essential tool for quantifying strain localisation in a wide range of materials. We aim to understand the origin of the strain distributions in Ni-based superalloys using a correlative approach. Strain distributions from HRDIC are correlated with electron backscatter diffraction (EBSD) for lattice rotation and diffraction-controlled electron channelling contrast imaging (ECCI) for the analysis of single dislocations and slip bands in the scanning electron microscope. This allows for the investigation of the effect of grain size, annealing twins and slip incompatibility at grain boundaries on strain localisation. It is observed that the presence and size of gamma prime precipitates in both the polycrystal and the single crystal affect strain localisation and the underlying defects. To understand surface vs. bulk behaviour, HRDIC strain maps are correlated with serial ECCI and also 3D EBSD serial sectioning in a Xe plasma focussed ion beam microscope.
||Planned: Supplemental Proceedings volume