Chromium(Cr) poisoning is one of the critical degradation issues to commercialize the durable and long-term stable SOFC systems. So far, Cr-poisoning mechanisms are the electrochemical induced Cr-vapor reduction and chemical reaction of cathode and Cr vapors around the cathode/electrolyte interfaces. Especially at the (La,Sr)(Co,Fe)O3/CeO2/ZrO2 interfaces, a significant amount of SrCrO4 is formed at the grain surfaces or triple phase boundaries which affects the reaction rates for oxygen reduction as well as O2- diffusion rates inside the (La,Sr)(Co,Fe)O3 due to loss of oxygen vacancies. However, in some cases, we found that the surface diffusion re-arranged the surface SrCrO4 to LaCrO3 composition. The rearranged LaCrO3 possess a perovskite oxide structure and it conducts the electron as well as small amounts of oxide ion (O2-). Also, the effect of CeO2 interlayer can reduce the Cr deposition because of the mission of H2O.