|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Analyzing Subsurface Dislocation Content of Ti-5Al-2.5Sn Alloy Using Micro-Laue Diffraction Based Streak Anlaysis and Transmission Electron Microscopy
||Chen Zhang, Shanoob Balachandran Nair, Hongmei Li, Philip Eisenlohr, Martin Crimp, Carl Boehlert, Ruqing Xu, Thomas Bieler
|On-Site Speaker (Planned)
The subsurface dislocation content of a Ti-5Al-2.5Sn (wt%) specimen deformed by uniaxial tension at ambient temperature was extracted from the micro-Laue diffraction patterns using two separate streak analysis methods based on streak directions and the Frank-Bilby equation (FBE), and compared with transmission electron microscopy (TEM) analysis of a sample extracted using focused ion beam in the same volume investigated with Laue diffraction. The micro-Laue diffraction patterns were collected using differential aperture x-ray microscopy (DAXM) at the Advanced Photon Source (APS), Argonne National Laboratory. The active slip systems (Burgers vector and slip plane) identified using the proposed streak analysis methods are mostly consistent with the TEM observations. By analyzing the peak streaks and neighboring orientation fields for each voxel, the FBE-based streak analysis can provide a spatially resolved dislocation density map non-destructively. This research was supported by DOE/BES grant DE-FG02-09ER46637, and APS beamline was supported by DOE contract DE-AC02-06CH11357.
||Planned: Supplemental Proceedings volume