|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||3D Orientation Mapping in the Transmission Electron Microscope
||Søren Schmidt, Peter Mahler Larsen, Hossein Alimadadi, Takeshi Kasama, Xiaoxu Huang
|On-Site Speaker (Planned)
The 3D Orientation Mapping in the Transmission Electron Microscope (3D-OMiTEM) technique enables characterization of nano-crystalline materials in the form of 3D grain maps with a spatial resolution of a few nm. The thickness of the sample is typically 100 nm. The method utilizes conical dark field scanning mode for data acquisition, where images are collected over a wide range of beam and sample tilts. Since the methodology is non-destructive structural 3D evolution of the nano-structure, arising e.g. from external annealing or deformation, can potentially be monitored. Here, we present the methodology, algorithms and latest applications.
||Planned: Supplemental Proceedings volume