|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Application of a Spectral Method Framework to Interrogate the Influences of Experimental Uncertainty on Crystal Plasticity
||Philip Eisenlohr, Pratheek Shanthraj, Martin Diehl, Chen Zhang, Thomas R Bieler, Franz Roters, Ruqing Xu
|On-Site Speaker (Planned)
A variational formulation of fast Fourier transform-based spectral methods to solve full-field crystal plasticity enables the leveraging of efficient non-linear solution algorithms and integration of multiple recent suggestions to overcome methodological limitations observed for high contrast in material properties. This framework is utilized to probe the sensitivity of the crystal kinematic response with regard to the subsurface grain structure, for which a novel non-destructive reconstruction technique is suggested that is based on spatially sparse probing by differential aperture X-ray microscopy (DAXM).
||Planned: EPD Congress Volume