|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials
||Atom-probe Tomography of Materials with Nanometer-Range Characteristic Dimensions
||Dieter Isheim, David N Seidman
|On-Site Speaker (Planned)
Materials with nanometer-range characteristic dimensions lend themselves naturally for investigation by atom-probe tomography (APT), capable of analytical imaging with subnanometer-scale spatial resolution in three dimensions. The material’s characteristic dimensions may already be close to the surface curvature required and thus APT analysis seems straight forward. In practice, however, controlled manipulation, targeting, positioning, and tip surface shaping of these materials frequently prove challenging. Focused-ion-beam (FIB) instruments equipped with a micromanipulator and gas injection systems for deposition provide a versatile platform for imaging, cutting, joining, and manipulating nano- or nanostructured materials, and thus allow to capture and target nanoparticles or specific nanostructural features for APT analysis. This presentation discusses examples of APT characterization of a variety of nanometer sized and nanostructured materials, including nanodiamond particles and catalytically grown silicon nanowires.
||Planned: Supplemental Proceedings volume