|About this Abstract
||2010 TMS Annual Meeting & Exhibition
||Solid-State Interfaces: Toward an Atomistic-Scale Understanding of Structure, Properties, and Behavior through Theory and Experiment
||Spatially Resolved Compositional Measurements Across Interfaces, Phase Separations, and Non-Conservative Faults in Complex Oxides
||Srinivasan Rajagopalan, G.B. Viswanathan, David McComb, Jan Ringnalda, Hamish Fraser
|On-Site Speaker (Planned)
Complex oxides have been the subject of intense study in the recent past. Of particular interest is the ability to characterize interfaces and faults in nanometer-scale thin films and multilayered versions of these materials, requiring structural and compositional resolutions at or near to the atomic scale. An advantageous technique involves the aberration-corrected (scanning) transmission electron microscope; when the spherical aberration of probe is corrected, compositional information can be determined with very high spatial resolution. This paper presents the results of an assessment of the ability to perform spatially resolved measurements of compositional variations across phase separations and faults in strontium titanate thin films, and interfaces between strontium and barium titanate multilayered couples. The role of intrinsic and extrinsic factors affecting these measurements will be discussed. Support from the National Science Foundation for the Materials Research Science and Engineering Center (MRSEC) under contract number DMR-0820414 is gratefully acknowledged.
||Definite: A CD-only volume